PHOTOMETRISCHE ANALYSE

Patent europeic · EP1725864 · Stritgà

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Numer da publicaziun
EP1725864
Numer da la dumonda
EP05799710
Gener
Patent europeic cun effect per la Svizra ed il Liechtenstein
Status
Stritgà
Scrittira da patent
Concedì
Annunzià
23-09-2005
Publitgà
29-11-2006
Concedì
09-01-2013
Stritgà
30-09-2013
Motiv
Taxa annuala betg pajada
Classas IPC
G01N 1/10 (2006.01)
G01N 1/00 (2006.01)
G01N 21/78 (2006.01)
G01N 21/03 (2006.01)
G01N 21/25 (2006.01)
Prioritad
US 949315 27.09.2004
US 117536 29.04.2005
US 157944 22.06.2005
Dumonda PCT
PCT/US2005/033985 23.09.2005
Publicaziun PCT
WO2006/036738 06.04.2006
Lingua da l’annunzia
englais
Funtauna
Swissreg

Istorgia

Quai che l’Institut federal da la proprietad intellectuala ha publitgà davart quest titel, il pli nov l’emprim.

  1. 24-04-2014

    Stritgà, taxa betg pajada

    Published in Swissreg on 24.04.2014

  2. 09-01-2013

    Concedì

    Published in Swissreg on 09.01.2013

Partidas

Possessur

Industrial Test Systems, Inc.

1875 Langston Street, Rock Hill, SC 29730, US

Inventur

JAUNAKAIS, Ivars

Charlotte, NC 28226, US

ANAND, Sanjay, Mohan

Charlotte, NC 28277, US

Il register numna mintga partida cun num ed adressa. In possessur u in represchentant vegn collià cun in’organisaziun, sch’exact ina unitad giuridica dal register da commerzi porta ses num; la via d’ina partida betg enconuschida uschia na vegn betg mussada qua.