PHOTOMETRISCHE ANALYSE

European patent · EP1725864 · Deleted

Register entry

Publication number
EP1725864
Application number
EP05799710
Kind
European patent with effect for Switzerland and Liechtenstein
Status
Deleted
Specification
Granted
Filed
Sep 23, 2005
Published
Nov 29, 2006
Granted
Jan 9, 2013
Deleted
Sep 30, 2013
Reason
Annual fee unpaid
IPC classes
G01N 1/10 (2006.01)
G01N 1/00 (2006.01)
G01N 21/78 (2006.01)
G01N 21/03 (2006.01)
G01N 21/25 (2006.01)
Priority
US 949315 27.09.2004
US 117536 29.04.2005
US 157944 22.06.2005
PCT application
PCT/US2005/033985 23.09.2005
PCT publication
WO2006/036738 06.04.2006
Filing language
English
Source
Swissreg

History

What the Federal Institute of Intellectual Property published about this title, newest first.

  1. Apr 24, 2014

    Deleted, fee unpaid

    Published in Swissreg on 24.04.2014

  2. Jan 9, 2013

    Granted

    Published in Swissreg on 09.01.2013

Parties

Holder

Industrial Test Systems, Inc.

1875 Langston Street, Rock Hill, SC 29730, US

Inventor

JAUNAKAIS, Ivars

Charlotte, NC 28226, US

ANAND, Sanjay, Mohan

Charlotte, NC 28277, US

The register names each party by name and address. A holder or agent is linked to an organization where exactly one entity of the commercial register bears its name; the street of a party not so recognised is not shown here.