SYSTEM ZUR OPTISCHEN INSPEKTION EINES SUBSTRATS UNTER VERWENDUNG DERSELBEN ODER VERSCHIEDENER WELLENLÄNGEN

European patent · EP4332557 · Deleted

Register entry

Publication number
EP4332557
Application number
EP22315203
Kind
European patent with effect for Switzerland and Liechtenstein
Status
Deleted
Specification
Granted
Filed
Aug 31, 2022
Published
Mar 6, 2024
Granted
Jun 26, 2024
Deleted
Mar 24, 2026
Reason
Annual fee unpaid
IPC classes
G01N 21/95 (2006.01)
G01N 21/64 (2006.01)
Filing language
English
Source
Swissreg

History

What the Federal Institute of Intellectual Property published about this title, newest first.

  1. Mar 24, 2026

    Deleted, fee unpaid

    Status of protective title
    Active → Cancelled
    Cancellation date
    24.03.2026
    Cause for cancellation
    Non-payment of renewal fee

    Published in Swissreg on 24.03.2026

  2. May 7, 2025

    Change

    Published in Swissreg on 07.05.2025

  3. Jun 26, 2024

    Granted

    Published in Swissreg on 26.06.2024

Parties

Holder

Unity Semiconductor

611, rue Aristide Bergès, 38330 Montbonnot-Saint-Martin, FR

Inventor

Benhadjsalem, Kaiss

38360 Sassenage, FR

Vienne, Guillaume

38700 Corenc, FR

Durand De Gevigney, Mayeul

38330 Montbonnot Saint Martin, FR

The register names each party by name and address. A holder or agent is linked to an organization where exactly one entity of the commercial register bears its name; the street of a party not so recognised is not shown here.